ACE Solution Co., Ltd.

ACE Solution Co., Ltd.

About ACE Solution ACE Solution specializes in high-end system integration across semiconductor testing, Silicon Photonics (SiPh), high-speed digital, and wireless communications. Leveraging cross-disciplinary engineering expertise, custom test fixtures, and modular software platforms, we deliver comprehensive non-destructive failure analysis (FA), material analysis (MA), and high-throughput final test (FT) solutions. Addressing high-power chip and heterogeneous integration trends, we provide industry-leading micro-area thermal characterization, optical alignment, and high-frequency electrical/optical test architectures to optimize CapEx, elevate equipment utilization, and accelerate time-to-market. SEMICON Taiwan 2026 Showcase Highlights Automated SiPh & CPO Test Quantifi Photonics: Modular, high-density PXIe optical test solutions for Silicon Photonics and CPO transceiver validation. Nexustest: Next-generation 1.6T 224G/lane optical module test platform integrating BERT, DCA, and CRU for high-throughput characterization. YONATA: Nanometer-precision active optical alignment systems for wafer-level and package-level SiPh coupling. FA / MA Thermal Analysis TherMap: Advanced TDTR/FDTR opto-thermal me

PV: Modules, Defect; Particle; Bump; Contamination Detection, Review or Inspection, Fiber Optic Inspection Instruments, Film Thickness; Thickness; Uniformity Measurement; Ellipsometer, Instruments; Bench Top Test, Microscopes: Optical Microscopes, Package Inspection; Lead Scanners, Resistivity Measurement; 4 point probe; Sheet resistance, Spectrometers; Fourier Transform Infrared (FTIR); Attenuated Total Reflectance FTIR (ATR-FTIR); Auge, Thermal Sensing, Measurement, Analysis, Wire Bonding Inspection; Test, Discrete Component Test Systems, Failure Analysis Systems, FPD Test; Measurement; Repair Equipment, Functional Test Systems, Handlers; Positioner Systems, Linear Test Systems, Logic Test Systems, Memory Test Systems, Optical Test Systems, Package Test Systems, Parametric Test Systems, Printed Circuit Board; Wire Board (PCB or PWB) Test and Repair, System on a Chip (SOC); Mixed Signal Test Systems, Test Head Manipulators and Docking Stations, Wireless, non-contact Test Systems, Test; Monitor Wafers; Reclaim or Virgin, Burn-In Boards; Performance Boards (incl. Low; High Temp and Ceramic), Probe Cards; DUT boards and other probing accessories (incl Ceramic and Special Purpose Probe Cards), Structural Circuits; Test; Thermal Fixturing, Test Sockets; Contactors and Contact accessories, Measurement and Control Technology, Robotics; Transfer Systems, Equipment Interface; Communication Protocols, Factory Automation; Cell Controller Software, Test Programs, Assembly, Automation & Robotics, Static; ESD Testing & Control Services, Test Services or Consulting, Sales; Manufacturers Representation or Distributors, Testing Institutes, Laboratory Apparatus and Supplies